Detection and Correction of Scanning Attitude of EMF Meter Using Machine Learning

Ken Sato, Takumi Miura, Yoshitsugu Kamimura

DOI

10.17023/3cfk-8v81

EMC

Members: Free
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Length: 00:15:57

30 Sep 2021

Chairs:

Prof. Wen-Yan Yin

Tags:

emc measurements and em environment

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