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Process Induced Vt Variability in Nanoscale FinFETs: Does Vt Extraction Methods Have Any Impact?

Mandar Bhoir and Thomas Chiarella and Lara Ragnarsson and Jerome Mitard and Naoto Horiguchi and Nihar Mohapatra

DOI
10.17023/vdzk-4p15
  • EDS
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    Length: 00:54:26

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