Skip to main content

Process Induced Vt Variability in Nanoscale FinFETs: Does Vt Extraction Methods Have Any Impact?

Mandar Bhoir and Thomas Chiarella and Lara Ragnarsson and Jerome Mitard and Naoto Horiguchi and Nihar Mohapatra

DOI
10.17023/vdzk-4p15
  • EDS
    Members: $5.00
    IEEE Members: $10.00
    Non-members: $20.00
    Length: 00:54:26

More Like This

Numerical Field Calculation in Electrical Engineering with Open Access Finite Element Method Software Tools (video)
11 Feb 2025

Numerical Field Calculation in Electrical Engineering with Open Access Finite Element Method Software Tools (video)

  • DEIS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
Emerging Digital Transmitters for Wireless Communication From RF to mm-Wave (video)
11 Feb 2025

Emerging Digital Transmitters for Wireless Communication From RF to mm-Wave (video)

  • MTT
    Members: Free
    IEEE Members: $9.00
    Non-members: $14.00
Grid-Edge 2025 Panel Presentation (bundle)
07 Feb 2025

Grid-Edge 2025 Panel Presentation (bundle)

  • PES
    Members: Free
    IEEE Members: $570.00
    Non-members: $1216.00