Simplified De-Embedding for Return Loss Estimation

The work presented in this paper addresses two important Signal Integrity applications. First, s-parameter measurements of a DUT (denoted by D) invariably involve a Test fixture (denoted by F). De-embedding requires the sparameters of the test fixture, and an s-parameter simulator. In a second application, it is desirable to know the return loss of a link comprising several parts which again requires an sparameter simulator. During a channel system architecture phase, quick estimates are needed. These are easy to do with insertion loss, but not with return loss, and this work presents a simple approximation useful in both cases.