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  • SPS
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    Length: 00:15:54
11 Jun 2021

We consider the problem of noisy group testing where the test results are corrupted by noise with an unknown distribution. We propose an adaptive test plan consisting of a hierarchy of biased random walks guided by a local sequential test which together lend adaptivity and agnosticism to the unknown noise model. We show that the proposed test plan is order optimal in both the population size and the error rate.

Chairs:
Dionysios Kalogerias

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  • SPS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
  • SPS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00