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DEEP LEARNING BASED WORKFLOW FOR ACCELERATED INDUSTRIAL X-RAY COMPUTED TOMOGRAPHY

Obaidullah Rahman, Singanallur Venkatakrishnan, Luke Scime, Paul Brackman, Curtis Frederick, Ryan Dehoff, Vincent Paquit, Amir Koushyar Ziabari

  • SPS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
Poster 10 Oct 2023

X-ray computed tomography (XCT) is an important tool for high-resolution non-destructive characterization of additively-manufactured metal components. XCT reconstructions of metal components may have beam hardening artifacts such as cupping and streaking which makes reliable detection of flaws and defects challenging. Furthermore, traditional workflows based on using analytic reconstruction algorithms require a large number of projections for accurate characterization - leading to longer measurement times and hindering the adoption of XCT for in-line inspections. In this paper, we introduce a new workflow based on the use of two neural networks to obtain high-quality accelerated reconstructions from sparse-view XCT scans of single material metal parts. The first network, implemented using fully-connected layers, helps reduce the impact of BH in the projection data without the need of any calibration or knowledge of the component material. The second network, a convolutional neural network, maps a low-quality analytic 3D reconstruction to a high-quality reconstruction. Using experimental data, we demonstrate that our method robustly generalizes across several alloys, and for a range of sparsity levels without any need for retraining the networks thereby enabling accurate and fast industrial XCT inspections.

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