Skip to main content

Substrate RF Losses and Non-linearities in GaN on Si HEMT Technology

Sachin Yadav, Pieter Cardinael, Ming Zhao, Komal Vondkar, Ahmad Khaled, Raul Rodriguez, Bjorn Vermeersch, Sergej Makovejev, Enrique Ekoga, Alexandre Pottrain, Niamh Waldron, Jean Pierre Raskin, Bertrand Parvais, Nadine Collaert

DOI
10.17023/ntvv-sf21
  • EDS
    Members: $5.00
    IEEE Members: $10.00
    Non-members: $20.00
    Length: 00:19:55

More Like This

Digital Engineering is Too Important to be Left Alone to MBSE Practitioners
02 Oct 2024

Digital Engineering is Too Important to be Left Alone to MBSE Practitioners

1.00 pdh
  • SYSC
    Members: Free
    IEEE Members: Free
    Non-members: Free
Large Substrate Manufacturing and Assembly Challenges
01 Oct 2024

Large Substrate Manufacturing and Assembly Challenges

  • EPS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
Large Substrate Manufacturing and Assembly Challenges
01 Oct 2024

Large Substrate Manufacturing and Assembly Challenges

1.00 pdh
  • EPS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00