Progressing -190 C to +500 C Durable SiC JFET ICs From MSI to LSI P. Neudeck, D. Spry, M. Krasowski, L. Chen, N. Prokop, L. Greer, C. Chang DOI 10.17023/kx5m-tk84 EDS Members: $5.00 IEEE Members: $10.00 Non-members: $20.00 Length: 00:19:59 15 Dec 2020 Tags: sic jfet ics IEEE greer spry durable iedm krasowski chang neudeck msi to lsi eds prokop progressing chen video
15 Dec 2020 Tags: sic jfet ics IEEE greer spry durable iedm krasowski chang neudeck msi to lsi eds prokop progressing chen video