A Machine Learning Resistant 3D PUF with 8 Layer Stacking Vertical RRAM and 0.014% Bit Error Rate Using In Cell Stabilization Scheme for IoT Security Applications Jianguo Yang DOI 10.17023/9g15-wt28 EDS Members: $5.00 IEEE Members: $10.00 Non-members: $20.00 Length: 00:19:20 15 Dec 2020 Tags: IEEE 8 layer stacking iot security resistant iedm 3d puf jianguo yang machine learning error rate eds vertical cell stabilization applications rram video
15 Dec 2020 Tags: IEEE 8 layer stacking iot security resistant iedm 3d puf jianguo yang machine learning error rate eds vertical cell stabilization applications rram video