Deep Insights into the Failure Mechanisms in Field Cycled Ferroelectric Hf 0.5 Zr 0.5 O2 Thin Film: TDDB Characterizations and First Principles Calculations Wei Wei DOI 10.17023/jwvz-rp73 EDS Members: $5.00 IEEE Members: $10.00 Non-members: $20.00 Length: 00:19:58 15 Dec 2020 Tags: wei wei failure mechanisms IEEE eds first principles calculations tddb characterizations deep insights iedm thin film video field cycled ferroelectric
15 Dec 2020 Tags: wei wei failure mechanisms IEEE eds first principles calculations tddb characterizations deep insights iedm thin film video field cycled ferroelectric