Improved resolution in structured illumination microscopy with 3D model-based restoration

We investigate the performance of our previously developed three-dimensional (3D) model-based (MB) method [1] for 3D structured illumination microscopy (3D-SIM) using experimental 3D-SIM data. In addition, we demonstrate in simulation that we can further improve the performance of our 3D-MB approach by including a positivity constraint through the reconstruction of an auxiliary function as it was previously suggested in speckle SIM [2]. We emphasize that our methods remove out-of-focus light from the entire volume via 3D processing that relies on a 3D forward imaging model, thereby providing more accurate results compared to other approaches that rely on 2D processing of a single plane from a 3D-SIM dataset [3]. Our 3D-MB approach provides improved resolution and optical-sectioning over the standard 3D generalized Wiener filter (3D-GWF) [4] method (the only other method besides ours that performs 3D processing).