Skip to main content

A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection

Nana Kankam Gyimah, Abeneezer Girma, Mahmoud Nabil Mahmoud, Shamila Nateghi, Abdollah Homaifar, Daniel Opoku

  • SMCS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
    Length: 00:12:21

More Like This

  • EPS
    Members: Free
    IEEE Members: Free
    Non-members: Free
  • MTT
    Members: Free
    IEEE Members: $9.00
    Non-members: $14.00