A Prescription for On-Wafer Millimeter-Wave and THz Transistor Characterization Part 1 Slides

Advances in microwave wafer probes and vector network analyzers now make possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter-wave, and even terahertz frequencies. Dr. Dylan Williams, winner of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement, will introduce you to the progress made on this subject at the National Institute of Standards and Technology. He will discuss the fundamental principles behind accurate on-wafer measurements, and show how adhering to these principles has led to the development of accurate on-wafer measurements for transistor characterization at frequencies as high as 1 THz.