Skip to main content

Clustering Wafer Defect Patterns

Clustering Wafer Defect Patterns Within the Semiconductor Industry Based on Wafer Maps, Using an Agile Unsupervised Deep Learning Approach
17 Oct 2021

Clustering Wafer Defect Patterns Within the Semiconductor Industry Based on Wafer Maps, Using an Agile Unsupervised Deep Learning Approach

  • SMCS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
Subscribe to Clustering Wafer Defect Patterns