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Reliability of Ultrathin High-K Dielectrics on Chemical-Vapor Deposited 2D Semiconductors
15 Dec 2020

Reliability of Ultrathin High-K Dielectrics on Chemical-Vapor Deposited 2D Semiconductors

  • EDS
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Device Miniaturization on High K Materials
15 Jul 2020

Device Miniaturization on High K Materials

  • MTT
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    IEEE Members: Free
    Non-members: Free