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Tutorial: Reliability Physics and Failure Mechanisms in Electronics Packaging
01 Jan 2023

Tutorial: Reliability Physics and Failure Mechanisms in Electronics Packaging

1.00 pdh
  • EPS
    Members: Free
    IEEE Members: Free
    Non-members: Free
Design Rules and Acceleration for Electromigration-Induced Failure: Coupled Modeling and Experimental Verification
01 Jan 2021

Design Rules and Acceleration for Electromigration-Induced Failure: Coupled Modeling and Experimental Verification

1.00 pdh
  • EPS
    Members: Free
    IEEE Members: Free
    Non-members: Free
Heterogeneous Integration Roadmap (HIR) Chapter 14 Modeling & Simulation
08 Jul 2020

Heterogeneous Integration Roadmap (HIR) Chapter 14 Modeling & Simulation

  • EPS
    Members: Free
    IEEE Members: Free
    Non-members: Free
New Results on Electromigration Modeling - A Departure from Blech''s Theory
25 Sep 2019

New Results on Electromigration Modeling - A Departure from Blech''s Theory

1.00 pdh
  • EPS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00