Implication of Channel Percolation in Ferroelectric FETs for Threshold Voltage Shift Modeling
Yang Xiang, M. Garcia Bardon, B. Kaczer, Md Nur K. Alam, L.-A. Ragnarsson, G. Groenseneken, J. Van Houdt
-
EDS
IEEE Members: $10.00
Non-members: $20.00Length: 00:19:58