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Characterization Scheme for Plasma Induced Defect Creation Due to Stochastic Lateral Straggling in Si Substrates for Ultra Low Leakage Devices
15 Dec 2020

Characterization Scheme for Plasma Induced Defect Creation Due to Stochastic Lateral Straggling in Si Substrates for Ultra Low Leakage Devices

  • EDS
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    Non-members: $20.00
GM 2019 - Distributed Demand Response Dilemma: Defect or Engage
06 Aug 2019

GM 2019 - Distributed Demand Response Dilemma: Defect or Engage

  • PES
    Members: Free
    IEEE Members: $10.00
    Non-members: $20.00