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Modeling of Hot Carrier Degradation in Nanowire, Nanosheet and Forksheet Devices
25 Jul 2023

Modeling of Hot Carrier Degradation in Nanowire, Nanosheet and Forksheet Devices

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  • EDS
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Gate-All-Around Strained Si 0.4 Ge 0.6 Nanosheet PMOS on Strain Relaxed Buffer for High Performance Low Power Logic Application
15 Dec 2020

Gate-All-Around Strained Si 0.4 Ge 0.6 Nanosheet PMOS on Strain Relaxed Buffer for High Performance Low Power Logic Application

  • EDS
    Members: $5.00
    IEEE Members: $10.00
    Non-members: $20.00
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