Skip to main content
ieee top header menu
IEEE.org
IEEE Xplore Digital Library
IEEE Standards
IEEE Spectrum
More Sites
Anonymous user menu
Cart
Create Account
Sign In
Conferences
Education
Member Resources
Publications
Leave this field blank
Search
IEEE Resource Center
IEEE.org
trapping
Showing 1 - 1 of 1 resources. Too many results? Use the search filters to refine your search.
Leave this field blank
Go
Sort by
Newest
Newest
Oldest
Sort by: Relevance
Title (A-Z)
Title (Z-A)
01 Mar 2020
A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs
EDS
Members:
$5.00
IEEE Members:
$10.00
Non-members:
$20.00
