A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs

Nilotpal Choudhury, Narendra Parihar, Nilesh Goel, Thirunavukkarasu A, Souvik Mahapatra

DOI

10.17023/w7d0-2x78

EDS

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Length: 01:06:04

01 Mar 2020

Tags:

nilotpal choudhury

thirunavukkarasu a

souvik mahapatra

narendra parihar

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