Exploring FinFET and Gate All-Around FET in SRAM Cell Arrays at the 3nm Process Node

Bennett Bush, Jacob Mack, Luke Hanks, Trinity Collector, Zhuoqi Cai, Da Eun Shim, Azad Naeemi

RFID

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Length: 00:03:57

01 Jul 2023

Tags:

Exploring FinFET

gate all around

SRAM Cell Arrays

3nm Process Node

Trinity Collector

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